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Dual Spot Xrf Analyzer for Coating Thickness Measurement, Gemstone Identification and High Precision Precious Metal Multi-Element Composition Analysis
4.0InStock Source-listed auditby Pureray Instrument Co., Ltd.
₹20,45,750
Description
Dual Spot Xrf Analyzer for Coating Thickness Measurement, Gemstone Identification and High Precision Precious Metal Multi-Element Composition Analysis, Find Details and Price about Xrf Analyzer Xrf Coating Thickness Analyzer from Dual Spot Xrf Analyzer for Coating Thickness Measurement, Gemstone Identification and High Precision Precious Metal Multi-Element Composition Analysis - Pureray Instrument Co., Ltd.
Specifications
Focusφ0.3mm
Noise<65db
OriginChina
Weight42kg(Net Weight)
DisplayComputer Screen
ElementComputer Multi Element Analyzer
HS Code9022199090
AnalysisX-ray Fluorescence (Xrf)
DetectorUSA Amptek Customized Fast-Sdd
FunctionStorage, Multi-Element Analysis
Frequency50±1HZ
Model NO.GoldSDD MC
