High-Precision Superior Non-Contact 3 in 1 Precision 3D Measuring Microscope Optical Profiler for Wafer Bump Height Inspection

Name: High-Precision Superior Non-Contact 3 in 1 Precision 3D Measuring Microscope Optical Profiler for Wafer Bump Height Inspection
Brand: Nanjing Kathmatic Technology Co., Ltd.
SKU: TPXYIEBlgGWO
Price: 6680000 INR

5.0InStock Source-listed auditby Nanjing Kathmatic Technology Co., Ltd.

Description

High-Precision Superior Non-Contact 3 in 1 Precision 3D Measuring Microscope Optical Profiler for Wafer Bump Height Inspection, Find Details and Price about Measuring Microscope Precision Measuring Microscope from High-Precision Superior Non-Contact 3 in 1 Precision 3D Measuring Microscope Optical Profiler for Wafer Bump Height Inspection - Nanjing Kathmatic Technology Co., Ltd.

Specifications

CPUIntel I7

Store1tb SSD

UsageIndustry

OriginChina

Lead Time30 days (1 - 1 Sets) 30 days (2 - 2 Sets) 30 days (3 - 3 Sets) To be negotiated ( > 3 Sets)

Model NO.KC-X3000series

PrincipleOptics

TrademarkKathmatic

Display Size27inches

Package Size65.00cm * 62.00cm * 39.00cm

SpecificationCustomized

Internal Memory32GB

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Payment

L/C, T/T, D/P, Western Union, Paypal, Money Gram

Port

Shanghai, China

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Supplier information

Nanjing Kathmatic Technology Co., Ltd.

Jiangsu, ChinaManufacturer/Factory & Trading Company

Audited supplier

294 staff

Ambient Humidity5%~80%Rh,No Condensation

Transport PackageCardboard Box

Display Resolution3840×2160

Stereoscopic EffectStereoscopic Effect

Package Gross Weight84.000kg

Focus Z-Axis Drive ModeMotor

Focus Z-Axis Movement Range100mm

Measuring Camera Resolution1200W

Measuring Camera Maximum Fps28fps

Operating Ambient TemperatureAmbient Humidity

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High-Precision Superior Non-Contact 3 in 1 Precision 3D Measuring Microscope Optical Profiler for Wafer Bump Height Inspection

Description

Specifications

Related products

Microscope Reticle Scale C-Mount Adapter Camera Lens for Microscope Monoculars Camera Tool Setter Sharpener Grinder

Supplier information

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