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(16 Slots/Htol) IC High Temperature Dynamic Burn-in Test System
InStock Source-listed auditby Hangzhou Zhongan Electronic Co., Ltd.
₹66,80,000≈ $80,000 · indicative, confirm with supplier
Supplier information
Audited supplier
Description
(16 Slots/Htol) IC High Temperature Dynamic Burn-in Test System, Find Details and Price about Test Equipment Life Test from (16 Slots/Htol) IC High Temperature Dynamic Burn-in Test System - Hangzhou Zhongan Electronic Co., Ltd.
Specifications
TypeIC Tester
UsageElectric Component Tester
OriginHangzhou, China
Weight600kg
DisplayComputer Screen
HS Code9030820000
Capacity16 Slots/ 3328 Duts
FunctionElectric Component Reliability Test/Burn-in Test
WarrantyWith Warranty
Model NO.BTI-E3000AT
CustomizedNon-Customized
EnvironmentRoom Temperature
