
Used Refurbished EL + VI Tester for Solar Module Production -Integrated Electroluminescence & Visual Inspection System. Dual-Mode Inspection: Combined EL (electroluminescence) and VI (visual inspection) in a single integrated station - detects micro-cracks, broken fingers, inactive cells, scratches, and foreign partic. AI Defect Classification: Advanced image processing with machine learning algorithms automatically categorizes defects by type, severity, and location - reducing operator judgment errors. High-Resolution EL Imaging: Cooled CCD/CMOS camera with uniform IR LED excitation captures detailed EL images with defect detection sensitivity down to 50 micrometer . Multi-Angle VI Lighting: Configurable LED bar lighting from 4+ angles captures surface defects from every direction - detects scratches, edge chips, and solder anomalies. less than or equal to 20s Cycle Time: High-speed inspection keeps pace with mainstream production lines at 180+ modules/hour throughput.